Imaging the Invisible: Pushing the Limits of Polymer Electron Microscopy

This is an exciting time for polymer electron microscopy. Recent improvements in instrumentation are pushing resolution limits to remarkable new heights, achieving imaging at 0.5 Å, while dual beam microscopes are enabling both 2D and 3D structural data acquisition from large sample volumes with voxel resolution below 3nm.

Join Enrique Gomez of The Pennsylvania State University for a discussion about recent improvements to electron microscopy instrumentation and emerging computation tools that overcome previous limitations to imaging polymers. He will describe how innovative electron microscopes are transforming the imaging of polymer microstructures despite the radiation sensitivity constraints of polymers and how the integration of multiple techniques within electron microscopes enable novel in-situ and in-operando measurements. See how advances in computational techniques and image analysis are unveiling new insights!

Then Ned Thomas of Texas A&M University will delve into the capabilities of dual beam microscopes, which use an ion beam for sample milling and an electron beam for imaging. Learn how this "slice and view" technique offers great advantages for producing high fidelity and statistically meaningful 3D structures of polymeric materials. Register now for this can't miss webinar featuring two researchers who are shaping the future of polymer electron microscopy.

This ACS Webinar is moderated by Dominik Konkolewicz of Miami University and co-produced with the ACS Division of Polymeric Materials: Science & Engineering (PMSE).